MPX5100DP

The MPX5100DP is a piezoresistive differential pressure transducer from NXP with fully integrated signal conditioning, temperature compensation, and calibration. Part of the MPX5xxx series, it measures differential pressure up to 100 kPa and provides a high-level analog output directly compatible with microcontroller ADC inputs. The device uses NXP’s patented silicon shear stress strain gauge technology combined with thin-film metallization and bipolar processing for accurate and stable pressure measurement. The dual side port configuration allows measurement of the pressure difference between two independently connected media sources.

The MPX5100DP uses a silicon diaphragm with implanted piezoresistive elements arranged in a Wheatstone bridge. When differential pressure is applied across the two ports, the diaphragm deflects, creating strain that changes the resistance of the piezoresistors. The resulting bridge imbalance voltage is amplified by the on-chip signal conditioning circuitry, which includes temperature compensation networks that correct for zero offset and span variations across the operating temperature range. The output is a ratiometric voltage proportional to the supply voltage, spanning from approximately 0.2 V at zero pressure to 4.7 V at full scale (100 kPa). This allows direct connection to an ADC with 5 V reference.

• Industrial process differential pressure monitoring
• HVAC filter status and air flow measurement
• Medical CPAP and ventilator systems
Barometric altitude measurement Pneumatic actuator position feedback