MPX5010DP

The MPX5010DP is a piezoresistive pressure transducer from NXP that integrates on-chip signal conditioning, temperature compensation, and calibration in a single monolithic device. Designed for microcontroller-based systems, it provides a high-level analog output voltage proportional to the applied differential pressure without requiring external amplification. The sensor uses NXP’s patented silicon shear stress strain gauge technology and is compensated over the -40°C to +125°C range. The dual side port configuration allows measurement of the pressure difference between two independently connected sources, making it ideal for air flow and differential pressure monitoring.

The MPX5010DP operates using a piezoresistive sensing element where a silicon diaphragm deflects under applied pressure, creating strain in embedded piezoresistors arranged in a Wheatstone bridge configuration. The bridge output is a small differential voltage proportional to the applied pressure. This raw signal is processed by on-chip amplification and temperature compensation circuitry that corrects for zero offset drift and span variation over temperature. The result is a ratiometric output voltage that swings from approximately 0.2 V at zero differential pressure to 4.7 V at full scale (10 kPa), with the output proportional to the supply voltage. The dual port design connects the two pressure sources to opposite sides of the diaphragm.

• HVAC variable air volume (VAV) damper control
• Medical CPAP and ventilator pressure monitoring
• Industrial clean room differential pressure
• Building automation fan filter monitoring
• Environmental weather stations